Approved MIL-STD-750 Test Methods

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Our facility is approved by the Defense Logistics Agency (DLA) to perform the following MIL-STD-750 test methods. MIL-STD-750 establishes uniform methods for testing semiconductor devices, ensuring reliability and performance across military and aerospace applications. Click on each testing method for more information!

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Environmental Tests (1000 Series)
Method 1016
Insulation Resistance

Method 1020
Electrostatic Discharge Sensitivity (ESD) Classification

Method 1021
Moisture Resistance

Method 1022
Resistance to Solvents

Method 1026
Steady-State Operation Life

Method 1027
Steady-State Operation Life (Sample Plan)

Method 1031
High-Temperature Life (Nonoperating)

Method 1032
High-Temperature (Nonoperating) Life (Sample Plan)

Method 1033 A, B
Reverse Voltage Leakage Stability

Method 1037
Intermittent Operation Life (Sample Plan)

Method 1038 A, B
Burn-In (for Diodes, Rectifiers, and Zeners)

Method 1039 A, B
Burn-In (for Transistors)

Method 1040 A, B
Burn-In (for Thyristors – Controlled Rectifiers)

Method 1041
Salt Atmosphere (Corrosion)

Method 1042
Burn-in and life test for power MOSFETs/Insulated Gate Bipolar Transistors (IGBT)

Method 1048
Blocking Life

Method 1051 A, F, G
Temperature Cycling (Air to Air)

Method 1054
Potted Environment Stress Test

Method 1055
Monitored Mission Temperature Cycle

Method 1056 A, B, D
Thermal Shock (Liquid to Liquid)

Method 1057 B
Resistance to Glass Cracking

Method 1071 A, B, E, G, H3
Hermetic Seal

Method 1081
Dielectric withstanding voltage

Mechanical Characteristics Tests (2000 Series)
Method 2005
Axial Lead Tensile Test

Method 2006 A, B, C, D, E
Constant Acceleration

Method 2016
Shock

Method 2017 A
Die Attach Integrity

Method 2026
Solderability

Method 2031 A, B, I, J, K
Resistance to Soldering Heat

Method 2036 A, E
Terminal Strength

Method 2037 D
Bond Strength (destructive bond pull test)

Method 2038 B
Surface Mount End Cap Bond Integrity

Method 2052 A
Particle Impact Noise Detection (PIND) Test

Method 2056
Vibration, Variable Frequency

Method 2066
Physical Dimensions

Method 2068
External Visual for Nontransparent Glass-Encased, Double Plug, Noncavity Axial Leaded Diodes

Method 2071
External Visual and Mechanical Examination

Method 2072
Internal Visual Transistor (Pre-Cap) Inspection

Method 2073 B
Visual Inspection for Unencapsulated Semiconductor Diode Die

Method 2074
Internal Visual Inspection (Discrete Semiconductor Diodes)

Method 2075
Decap Internal Visual Design Verification

Method 2076
Radiography

Method 2078
Internal Visual for Wire Bonded Diodes/Rectifiers

Method 2101 SB
Destructive Physical Analysis for Diodes

Electrical Characteristics Tests for Bipolar Transistors (3000 Series)
Method 3001
Breakdown Voltage, Collector to Base

Method 3011
Breakdown Voltage, Collector to Emitter

Method 3026 A, B, C, D
Breakdown Voltage, Emitter to Base

Method 3036
Collector to Base Cutoff Current

Method 3041
Collector to Emitter Cutoff Current

Method 3051
Safe Operating Area (Continuous DC)

Method 3053 B, C
Safe Operating Area (Switching)

Method 3061
Emitter to Base Cutoff Current

Method 3066
Base to Emitter Voltage (Saturated or Nonsaturated)

Method 3071
Saturation Voltage and Resistance

Method 3076
Forward-Current Transfer Ratio

Circuit Performance & Thermal Resistance (3100 Series)
Method 3100
Junction Temperature Measurement at Burn-In & Life Test

Method 3101
Thermal Impedance & Thermal Response Testing of Diodes

Method 3131
Steady State & Transient Thermal Impedance Testing of Transistors (Delta Base-Emitter Voltage Method)

Method 3161
Thermal Impedance Measurements for Vertical Power MOSFETs (Delta Source Drain Voltage Method)

Method 3181
Thermal Resistance for Thyristors

Low Frequency Tests (3200 Series)
Method 3201
Small-Signal Short-Circuit Input Impedance

Method 3206
Small-Signal Short-Circuit Forward-Current Transfer Ratio

Method 3211
Small-Signal Open-Circuit Reverse-Voltage Transfer Ratio

Method 3216
Small-Signal Open-Circuit Output Admittance

Method 3236
Open Circuit Output Capacitance

Method 3240
Input Capacitance (Output Open-Circuited or Short-Circuited)

Method 3246
Noise Figure

Method 3251 A, B
Pulse Response

High Frequency Tests (3300 Series)
Method 3301
Small-Signal Short-Circuit Forward-Current Transfer-Ratio Cutoff Frequency

Method 3306
Small-Signal Short-Circuit Forward-Current Transfer Ratio

MOS Field-Effect Transistor Tests (3400 Series)
Method 3401
Breakdown Voltage, Gate to Source

Method 3403
Gate to Source Voltage or Current

Method 3405
Drain to Source On-State Voltage

Method 3407
Breakdown Voltage, Drain to Source

Method 3411
Gate Reverse Current

Method 3413
Drain Current

Method 3421
Static Drain to Source On-State Resistance

Method 3423
Small-Signal, Drain to Source On State Resistance

Method 3470
Single Pulse Unclamped Inductive Switching

Method 3471
Gate Charge

Method 3472
Switching Time Test

Method 3473
Reverse Recovery Time and Recovered Charge for Power MOSFET (drain-to-source) and Power Rectifiers with trr <= 100 ns

Method 3474
Safe Operating Area for Power MOSFETs or IGBTs

Method 3475
Forward Transconductance (Pulsed DC Method) of Power MOSFETs or IGBTs

Method 3476
Test Procedure for Measuring dv/dt During Reverse Recovery of Power MOSFET Transistors

Diode Electrical Characteristics (4000 Series)
Method 4001
Capacitance

Method 4011
Forward Voltage

Method 4016
Reverse Current Leakage

Method 4021
Breakdown Voltage (Diodes)

Method 4022
Breakdown Voltage (Voltage Regulators and Voltage-Reference Diodes)

Method 4023 A, B
Scope Display

Method 4026
Forward Recovery Time and Peak Forward Recovery Voltage

Method 4031 A, B
Reverse Recovery Characteristics

Method 4051
Small-Signal Reverse Breakdown Impedance

Method 4065
Peak Reverse Power Test

Method 4066 A1, A2, B
Surge Current and Impulse Clamp Voltage

Method 4071
Temperature Coefficient of Breakdown Voltage

Method 4081
Thermal Resistance of Diodes (Forward Voltage, Switching Method)

Thyristor (Controlled Rectifier) Tests (4200 Series)
Method 4201
Holding Current

Method 4206
Forward Blocking Current

Method 4211
Reverse Blocking Current

Method 4219
Reverse Gate Current

Method 4221
Gate-Trigger Voltage

Method 4223
Gate-Controlled Turn-On Time

Method 4224
Circuit-Commutated Turn-Off Time

Method 4226
Forward “On” Voltage

Method 4231
Exponential Rate of Voltage Rise

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